Fast, nanometer-precise XY motion enables active image and laser-beam stabilization, pixel shifting, and super-resolution imaging in advanced optical systems.

Shrewsbury, MA - Physik Instrumente (PI), a global leader in photonics, piezo and nanopositioning technologies, highlights its P-733 XY piezo scanning stage as a high-performance solution for applications that demand ultrafast, nanometer-precise motion, including image stabilization, pixel-shift imaging, and resolution enhancement. The P-733.2 provides travel ranges to 100µm × 100µm, resolution to 0.1nm with capacitive sensors, a zero-play flexure guidance system, and a 50mm × 50mm clear aperture for transmitted-light applications. PI also offers the P-733.3 XYZ version for applications that require an additional Z axis.

Piezo scanning stages are increasingly used in advanced optical and imaging and laser systems to compensate for vibration and motion in real time and to execute precise sub-pixel shifts of an image sensor, focal plane array or optical component. This enables multiple offset images to be captured and digitally combined, improving sharpness and increasing effective resolution beyond the native pixel grid. PI notes that fast piezo scanners can operate at video frequencies and cover the small motion ranges required between adjacent pixels, making them well suited for shake suppression, microscanning, and super-resolution imaging. Piezo scanners are also used to improve the performance of laser micro hole drilling systems. With high dynamics, parallel kinematics, and direct position feedback for active error compensation, the P-733 platform is designed for demanding industrial and scientific imaging and laser applications where speed, repeatability, and precision are critical.

Industries & Applications Served
Aerospace, photonics, semiconductors, optics, microscopy, astronomy, image stabilization, laser-beam stabilization, image resolution enhancement, nanopositioning